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Accelerated Testing
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| March 8, 2006 | |
| 7:30am | Registration, coffee |
| 8:00am-5:00pm | Course |
| March 9, 2006 | |
| 7:30am | Coffee |
| 8:00am-5:00pm | Course |
| March 10, 2006 | |
| 7:30am | Coffee |
| 8:00am-4:00pm | Course |
Instructor: Dr. Wayne Nelson
Many products last for years under normal use conditions. However, product tests must quickly yield reliable information for management and engineering decisions. Accelerated testing quickly yields such information. Test specimens are subjected to higher than normal levels of temperature, voltage, humidity, vibration, etc., and fail much sooner. Then a physical-statistical model is fitted to the early failure data, yielding estimates of product reliability under normal use conditions, including the failure rate, the population percentage failing on warranty or during design life, the mean time to failure, etc. This course shows how to measure and improve the reliability of diverse products.
Benefits
You will learn how to use the latest methods to successfully:Who should attend?
This course will benefit engineers, statisticians, and others working in product development, reliability, testing, manufacturing, procurement, and data analysis. You will learn to plan efficient accelerated tests and to accurately estimate product reliability and improve reliability using test data. To benefit fully, you need a working knowledge of a basic Statistics course.
Applications
The methods are applied to a variety of products including:
You will apply the methods to actual applications, including your own data, which you are asked to bring.
Text
The course text Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, published by Wiley (2004), was written by Wayne Nelson. The textbook, plotting papers, computer program information, and other reference materials are furnished at the course.
Instructor